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Title:
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents |
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Division: Nano-related / Springer / 英文版 |
Author/Editor: Andrew J. Fisher Lev Kantorovich Werner Hofer Adam Foster Star:  |
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ISBN: 0387400907 |
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Introduce Date: 2007年03月12日13:48 , Release Date: 2007年03月12日18:12 |
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Introducer: skyflyzw , Rate: 0/143 |
| Format: pdf(editorial) Download |
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| Description: |
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
by Adam Foster (Author), Werner Hofer (Author)
Hardcover: 281 pages Language: English
Publisher: Springer; 1 edition (June 28, 2006)
ISBN-10: 0387400907 ISBN-13: 978-0387400907
About this book
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.
Written for:
University, industry and government researchers in physics (including biophysics), materials science, and chemistry working at the nanoscale, advanced undergraduate and graduate students in these fields
http://www.springer.com/west/hom ... p;changeHeader=true
http://www.amazon.com/Scanning-P ... 3678245&sr=11-1
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